Hi everyone.
I read a post over at Nano Nook that deals with all sorts of cool topics at the nanoscale. There is a post there that describes an atomic force microscope (AFM) that can be used to measure the surface topography and even chemical composition using an oscillating tip that is scanned across a material. The technology uses a laser to accurately measure the oscillation phase (timing of oscillations) and amplitude (the distance of vibration) of the tip. Take a look at Nano Nook's post for a nice diagram and more information! Also check out his links that give even more detailed information if you are intrigued.
Nice way to ref NN's blog, Ben. And AFMs are cool.
ReplyDeleteThey are cool. I have actually been able to use the one in the CSM Physics building, and it looks a lot like a regular light microscope (same size), but it is clearly a lot more complicated and incredibly more precise. Unfortunately, I had little success with my attempts at using it because it's a tricky machine to work with.
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